半导体集成电路 微处理器及外围接口电路电参数测试方法的基本原理
Generalprinciple of measuring methods of microprocessors and peripheral interface circuits’ parameters for semiconductor integrated circuits
标准状态
发布于：1991-04-28
实施于：1991-12-01
已废止
基本信息
内容预览
Generalprinciple of measuring methods of microprocessors and peripheral interface circuits’ parameters for semiconductor integrated circuits